Statistics Development & Application Manager
台灣積體電路製造股份有限公司
竹科
6天前

Description

1.Improve SPC quality system including Cpk, control limit, SPEC, tool matching for operation and non-operation SPC charts.

2.Develop / enhance statistical methodology to solve statistical problems.

3.Reach department goal on DPPM reduction, risk prediction, cost effective quality gating, and abnormal early detection.

4.Key projects : By part SPEC tightening, enhance control limit / SPEC methodology for non-Normal distribution e.g. particle, R / S / U, GOF, COA, backend FDC, ADC, FAC, KLA.

Personal Attributes

1.Pro-active, innovative, god judgement

2.Resilient, positive and confident under pressure

Other Requirements

1.More than 15 years of experience in semi-conductor industry

2.Experience in SPC, statistical problem solving

3.Ph.D. or Master in the related field of Statistics

4.Good project management skills

5.Capable to communicate in English in business occasions

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